Data Cruncher™
250 East Gish Road
San Jose, CA 95112
Tel:(408)487.1700 Fax:(408)487.1707
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Features at a glance.... 

Test Data Analysis. Data Cruncher features the most commonly used statistical calculations (Average, Standard Deviation and CPK) and presented in a report for easy analysis. 

Statistical Data from more than one lot can be shown side by side for easy comparison.
Histogram Charts.  Histogram of  test parameters can be produced to show trends in parametric test results. Data from more than one lots can be combined and analyzed in one chart. 

Wafer Map and Die Info. Shows a graphical map of binning test results, color coded with the bin number indicated for easy identification. Clicking on a die will show XY coordinates and bin value.

 

 Stacked Wafer Maps. Applicable to wafer probe data for  showing a graphical map of binning results for a number of wafers. Tally of failed bins per wafer die position is displayed on screen.
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© Copyright Notice:
This software is copyrighted, with all rights reserved. Under the copyright laws, the software may not be copied, in whole or in part, without the written consent of U.S. Export Authority, Inc., except as provided in the applicable U.S. Export Authority, Inc., software license agreement. Under the law, copying includes translating into another language or format.

The software contains proprietary, confidential and unpublished information of U.S. Export Authority, Inc.,

No use or disclosure of any portion of this software may be made without the prior express written consent of U.S. Export Authority, Inc.